IEEE - Institute of Electrical and Electronics Engineers, Inc. - Correction for Metastability in the Quantification of PID in Thin-Film Module Testing

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Peter Hacke ; Sergiu Spataru ; Steve Johnston
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 2,819 - 2,822
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366437
Regular:

A fundamental change in the analysis for the accelerated stress testing of thin-film modules is proposed, whereby power changes due to metastability and other effects that may occur due to the... View More

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