IEEE - Institute of Electrical and Electronics Engineers, Inc. - In Situ Raman Monitoring of Kesterite CU2ZnSnS4 Phase Formation from Sulfurization of Sol-gel Oxide Precursors

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Osama Awadallah ; Joseph Hernandez ; Andriy Durygin ; Zhe Cheng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 3,473 - 3,477
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366144
Regular:

Formation of kesterite Cu2ZnSnS4 (CZTS) thin films from sulfurization of sol-gel derived oxide precursor was successfully monitored using advanced in situ Raman... View More

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