IEEE - Institute of Electrical and Electronics Engineers, Inc. - Search for Microstructural Defects as Nuclei for PID-Shunts in Silicon Solar Cells

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Volker Naumann ; Otwin Breitenstein ; Jan Bauer ; Christian Hagendorf
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 1,376 - 1,380
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366322
Regular:

Up to now, the formation process of stacking faults leading to PID-shunting of silicon solar cells is still unknown. In particular, the type of primordial defects that define the position of... View More

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