IEEE - Institute of Electrical and Electronics Engineers, Inc. - Assessing the defect responsible for LeTID: temperature- and injection-dependent lifetime spectroscopy

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Mallory A. Jensen ; Yan Zhu ; Erin E. Looney ; Ashley E. Morishige ; Carlos Vargas ; Ziv Hameiri ; Tonio Buonassisi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 3,290 - 3,294
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366132
Regular:

Temperature- and injection-dependent lifetime spectroscopy (TIDLS) is employed to study the defect responsible for light- and elevated temperature-induced degradation (LeTID). In our previous... View More

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