IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental Evidence For CdS-related Transport Barrier in Thin Film Solar Cells and Its Impact on Admittance Spectroscopy

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Florian Werner ; Anastasiya Zelenina ; Susanne Siebentritt
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 2,478 - 2,481
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366797
Regular:

We measure the temperature-dependent current-voltage characteristics of a Mo/CdS/i-ZnO/Al:ZnO thin film stack, which is conventionally used as a buffer/window stack at the front of... View More

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