IEEE - Institute of Electrical and Electronics Engineers, Inc. - Damage-free laser ablation for emitter patterning of silicon heterojunction interdigitated back-contact solar cells

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Menglei Xu ; Twan Bearda ; Miha Filipic ; Hariharsudan Sivaramakrishnan Radhakrishnan ; Maarten Debucquoy ; Ivan Gordon ; Jozef Szlufcik ; Jef Poortmans
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 1,233 - 1,236
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366264
Regular:

We present a novel process scheme for a-Si:H patterning using damage-free laser ablation, resulting in a simple, fast, and photolithography-free emitter patterning of silicon heterojunction... View More

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