IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measuring Diode Resistivity of Passivated Contacts

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): San Theingi ; William Nemeth ; David L. Young ; Paul Stradins ; Benjamin G. Lee
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 1,832 - 1,834
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366681
Regular:

A technique of examining carrier-selective, passivated contacts is presented, where the contact resistivity is found from the measured diode characteristic. Importantly, this extends the... View More

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