IEEE - Institute of Electrical and Electronics Engineers, Inc. - Microscopic Distribution of Luminescence from Dislocation Clusters in Multicrystalline Silicon Wafers

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): H. T. Nguyen ; M. A. Jensen ; L. Li ; C. Samundsett ; H. C. Sio ; B. Lai ; T. Buonassisi ; D. Macdonald
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 3,295 - 3,299
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366493
Regular:

We investigate correlations among various subband-gap luminescence centers (so-called D-lines D1/D2/D3/D4) and the band-to-band luminescence signal, and their microscopic distributions, around... View More

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