IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterization of Modules and Arrays with Suns Voc

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Alex Killam ; Stuart Bowden
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 2,719 - 2,722
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366428
Regular:

Suns-VOC is currently used as a characterization technique for cell level testing. The idea of Suns-VOC can be applied using natural light to modules and arrays to characterize the performance,... View More

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