IEEE - Institute of Electrical and Electronics Engineers, Inc. - Field Investigations of Potential-Induced Degradation (PID) for Crystalline Silicon PV Panels in Different Climates

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Yifeng Chen ; Peter Hacke ; Yong Sheng Khoo ; Kaitlyn VanSant ; Zigang Wang ; Wei Luo ; Jing Chai ; Chris Deline ; Yan Wang ; Armin G. Aberle ; Pietro P. Altermatt ; Zhiqiang Feng ; Sarah Kurtz ; Pierre J. Verlinden
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 1,922 - 1,926
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366476
Regular:

The relationship between field performance and indoor chamber measurement for potential-induced degradation in crystalline silicon PV modules is still unclear. Many acceleration models have been... View More

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