IEEE - Institute of Electrical and Electronics Engineers, Inc. - Self-reference procedure to reduce uncertainty in module calibration

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): D. H. Levi ; C. R. Osterwald ; S. Rummel ; L. Ottoson ; A. Anderberg
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 467 - 471
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366752
Regular:

This paper presents a composite measurement approach that capitalizes on complimentary strengths of 3 different test beds to significantly reduce uncertainty in I-V parameters for secondary module... View More

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