IEEE - Institute of Electrical and Electronics Engineers, Inc. - Investigating PID Shunting in Polycrystalline Silicon Modules via Multi-Scale, Multi-Technique Characterization

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Steven P. Harvey ; John Moseley ; Adam Stokes ; Andrew Norman ; Brian Gorman ; Peter Hacke ; Steve Johnston ; Mowafak Al-Jassim
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 1,381 - 1,384
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366324
Regular:

Here we present a method for calculating the TCO sheet resistance of complete thin film modules using EL imaging. The method uses the characteristic decay of the junction voltage over the width of... View More

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