IEEE - Institute of Electrical and Electronics Engineers, Inc. - Local Measurements of Surface Capacitance by Electrostatic Force Microscopy on Cu(In, Ga)Se2Materials

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC)

Author(s): Tomoaki Ishii ; Takashi Minemoto ; Takuji Takahashi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2017
Conference Location: Washington, DC, USA
Conference Date: 25 June 2017
Page(s): 455 - 458
ISBN (Electronic): 978-1-5090-5605-7
DOI: 10.1109/PVSC.2017.8366110
Regular:

We have performed electrostatic force microscopy (EFM) on Cu(In,Ga)Se2 thin films with different Ga contents to examine their surface depletion capacitance locally. Especially from the... View More

Advertisement