IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analog Fault Identification in RF Circuits using Artificial Neural Networks and Constrained Parameter Extraction

2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)

Author(s): Andres Viveros-Wacher ; Jose E. Rayas-Sanchez
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Conference Location: Reykjavik, Iceland
Conference Date: 8 August 2018
Page(s): 1 - 3
ISBN (Electronic): 978-1-5386-5204-6
ISBN (USB): 978-1-5386-5203-9
DOI: 10.1109/NEMO.2018.8503117
Regular:

The increase of analog and mixed-signal circuitry in modern RF and microwave integrated circuits demands for improved analog fault diagnosis methods. While digital fault diagnosis is well... View More

Advertisement