EPE Association - Limits of SiC MOSFETs' Parameter Deviations for Safe Parallel Operation

2018 20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe)

Author(s): Teresa Bertelshofer ; Andreas Marz ; Mark.-M. Bakran
Publisher: EPE Association
Publication Date: 1 September 2018
Conference Location: Riga, Latvia, Latvia
Conference Date: 17 September 2018
ISBN (Electronic): 978-9-0758-1528-3
ISBN (USB): 978-9-0758-1529-0
Regular:

This paper presents a numerical method combined with a device simulation model used to analyse the parallel connection of several SiC MOSFET dies. Parallel connection is necessary to achieve the... View More

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