IEEE - Institute of Electrical and Electronics Engineers, Inc. - Solid geometrv based modelling of non-uniform attenuation and compton scattering in objects for SPECT imaging systems

Author(s): Huili Wang ; Ronald J. Jaszczak ; David R. Gilland ; Kim L. Greer ; R. Edward Coleman
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 1993
Volume: 40
Page(s): 1,305 - 1,312
ISSN (Electronic): 1558-1578
ISSN (Paper): 0018-9499
DOI: 10.1109/TNS.1993.8526577
Regular:

A solid geometry based approach is used to model non-uniform attenuation and Compton scattering in irregularly shaped objects for Monte Carlo simulated single photon emission computed tomography... View More

Advertisement