IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design of a hardware testing system for the D zero detector

Author(s): R. Angstadt ; M. E. Johnson ; M. I. Martin ; M. S. Matulik ; M. Utes
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 1993
Volume: 40
Page(s): 1,282 - 1,285
ISSN (Electronic): 1558-1578
ISSN (Paper): 0018-9499
DOI: 10.1109/TNS.1993.8526783
Regular:

Testing a system as large as the D Zero data acquisition system is difficult. The use of IBM compatible personal computers in a hardware test system that can run on any size system from an... View More

Advertisement