IEEE - Institute of Electrical and Electronics Engineers, Inc. - Micro computed tomography: removal of translational stage backlash

Author(s): John P. Hogan ; Robert A. Gonsalves ; Allen S. Krieger
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 1993
Volume: 40
Page(s): 1,238 - 1,241
ISSN (Electronic): 1558-1578
ISSN (Paper): 0018-9499
DOI: 10.1109/TNS.1993.8526784
Regular:

Errors in projection position arise when the resolution required by tomographic systems approaches the tolerance of the translational stage. These shifts in the projection data, commonly known as... View More

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