IEEE - Institute of Electrical and Electronics Engineers, Inc. - Is There a Robust Technique for Selecting Aspect Ratios in Line Charts?

Author(s): Yunhai Wang ; Zeyu Wang ; Lifeng Zhu ; Jian Zhang ; Chi-Wing Fu ; Zhanglin Cheng ; Changhe Tu ; Baoquan Chen
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Comput. Graphics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2018
Volume: 24
Page(s): 3,096 - 3,110
ISSN (CD): 2160-9306
ISSN (Electronic): 1941-0506
ISSN (Paper): 1077-2626
DOI: 10.1109/TVCG.2017.2787113
Regular:

The aspect ratio of a line chart heavily influences the perception of the underlying data. Different methods explore different criteria in choosing aspect ratios, but so far, it was still unclear... View More

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