IEEE - Institute of Electrical and Electronics Engineers, Inc. - Is There a Robust Technique for Selecting Aspect Ratios in Line Charts?
|Author(s):||Yunhai Wang ; Zeyu Wang ; Lifeng Zhu ; Jian Zhang ; Chi-Wing Fu ; Zhanglin Cheng ; Changhe Tu ; Baoquan Chen|
|Sponsor(s):||IEEE Comput. Soc. Tech. Committee on Comput. Graphics|
|Publisher:||IEEE - Institute of Electrical and Electronics Engineers, Inc.|
|Publication Date:||1 December 2018|
|Page(s):||3,096 - 3,110|
The aspect ratio of a line chart heavily influences the perception of the underlying data. Different methods explore different criteria in choosing aspect ratios, but so far, it was still unclear... View More
The aspect ratio of a line chart heavily influences the perception of the underlying data. Different methods explore different criteria in choosing aspect ratios, but so far, it was still unclear how to select aspect ratios appropriately for any given data. This paper provides a guideline for the user to choose aspect ratios for any input 1D curves by conducting an in-depth analysis of aspect ratio selection methods both theoretically and experimentally. By formulating several existing methods as line integrals, we explain their parameterization invariance. Moreover, we derive a new and improved aspect ratio selection method, namely the $L_1$ -LOR (local orientation resolution), with a certain degree of parameterization invariance. Furthermore, we connect different methods, including AL (arc length based method), the banking to 45 $^\circ$ principle, RV (resultant vector) and AS (average absolute slope), as well as $L_1$ -LOR and AO (average absolute orientation). We verify these connections by a comparative evaluation involving various data sets, and show that the selections by RV and $L_1$ -LOR are complementary to each other for most data. Accordingly, we propose the dual-scale banking technique that combines the strengths of RV and $L_1$ -LOR, and demonstrate its practicability using multiple real-world data sets.View Less