IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Study on Bandgap Reference Circuit With Leakage-Based PTAT Generation

Author(s): Youngwoo Ji ; Byungsub Kim ; Hong-June Park ; Jae-Yoon Sim
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2018
Volume: 26
Page(s): 2,310 - 2,321
ISSN (Electronic): 1557-9999
ISSN (Paper): 1063-8210
DOI: 10.1109/TVLSI.2018.2852802
Regular:

This paper presents detailed analyses on leakage-based bandgap reference (BGR) circuit for ultralow-power applications. Design considerations for power supply rejection ratio and noise... View More

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