IEEE - Institute of Electrical and Electronics Engineers, Inc. - Perceptions, Expectations, and Challenges in Defect Prediction

Author(s): Zhiyuan Wan ; Xin Xia ; Ahmed E. Hassan ; David Lo ; Jianwei Yin ; Xiaohu Yang
Sponsor(s): IEEE Comput. Soc. Tech. Council on Software Eng.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2326-3881
ISSN (Electronic): 1939-3520
ISSN (Paper): 0098-5589
DOI: 10.1109/TSE.2018.2877678
Regular:

Defect prediction has been an active research area for over four decades. Despite numerous studies on defect prediction, the potential value of defect prediction in practice remains unclear. To... View More

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