IEEJ Industry Application Society - New Screening Method for Improving Transient Current sharing of Paralleled SiC MOSFETs

2018 International Power Electronics Conference (IPEC-Niigata 2018-ECCE Asia)

Author(s): Junji Ke ; Zhibin Zhao ; Peng Sun ; Huazhen Huang ; James Abuogo ; Xiang Cui
Publisher: IEEJ Industry Application Society
Publication Date: 1 May 2018
Conference Location: Niigata, Japan
Conference Date: 20 May 2018
Page(s): 1,125 - 1,130
ISBN (Electronic): 978-4-88686-405-5
ISBN (USB): 978-4-88686-403-1
DOI: 10.23919/IPEC.2018.8507893

In this paper the effect of the spread of SiC MOSFET device parameters on transient current sharing is investigated. To aid in this investigation, the coefficient of variation is proposed firstly... View More