IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dione: A Framework for Automatic Profiling and Tuning Big Data Applications

2018 IEEE 34th International Conference on Data Engineering (ICDE)

Author(s): Nikos Zacheilas ; Stathis Maroulis ; Thanasis Priovolos ; Vana Kalogeraki ; Dimitrios Gunopulos
Sponsor(s): IEEE Comput. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2018
Conference Location: Paris, France
Conference Date: 16 April 2018
Page(s): 1,637 - 1,640
ISBN (Electronic): 978-1-5386-5520-7
ISSN (Electronic): 2375-026X
DOI: 10.1109/ICDE.2018.00195
Regular:

In this demonstration we present Dione a novel framework for automatic profiling and tuning big data applications. Our system allows a non-expert user to submit Spark or Flink applications... View More

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