IEEE - Institute of Electrical and Electronics Engineers, Inc. - Near-Field Photocurrent Mapping of MoS 2 -based Device at Nanoscale

2018 IEEE Research and Applications of Photonics In Defense Conference (RAPID)

Author(s): Rugang Geng ; Yohannes Abate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Conference Location: Miramar Beach, FL, USA
Conference Date: 22 August 2018
Page(s): 1
ISBN (Electronic): 978-1-5386-5349-4
DOI: 10.1109/RAPID.2018.8509018
Regular:

Summary form only given. Utilizing scattering-type scanning near-field optical microscopy (s-SNOM) with electrical read-out, we have demonstrated the ability of mapping optical and electronic... View More

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