IEEE - Institute of Electrical and Electronics Engineers, Inc. - Spatio-Temporal Networks of Social Conflicts: Analysis and Modeling

2018 IEEE/ACM International Conference on Advances in Social Networks Analysis and Mining (ASONAM)

Author(s): Gunjan Sehgal ; Kiran Sharma ; Arnab Chatterjee ; Anirban Chakraborti
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2018
Conference Location: Barcelona, Spain
Conference Date: 28 August 2018
Page(s): 740 - 743
ISBN (Electronic): 978-1-5386-6051-5
ISSN (Electronic): 2473-991X
DOI: 10.1109/ASONAM.2018.8508266
Regular:

Social interactions can be both positive and negative, and at various spatial and temporal scales. Negative interactions such as conflicts are often influenced by political, economic and social... View More

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