IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sensitivity of Transient Stability Critical Clearing Time

Author(s): Shikha Sharma ; Sai Pushpak ; Venkatesh Chinde ; Ian Dobson
Sponsor(s): IEEE Power Engineering Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2018
Volume: 33
Page(s): 6,476 - 6,486
ISSN (Electronic): 1558-0679
ISSN (Paper): 0885-8950
DOI: 10.1109/TPWRS.2018.2854650
Regular:

Once the critical clearing time of a fault leading to transient instability has been computed, it is desirable to quantify its dependence on system parameters. We derive, for a general power... View More

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