IEEE - Institute of Electrical and Electronics Engineers, Inc. - Large-signal noise, frequency conversion, and parametric instabilities in IMPATT diode networks

Author(s): M.E. Hines
Sponsor(s): IEEE Publication
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1972
Volume: 60
Page(s): 1,534 - 1,548
ISSN (Paper): 0018-9219
ISSN (Online): 1558-2256
DOI: 10.1109/PROC.1972.8952
Regular:

A theoretical treatment is presented of some of the nonlinear properties of the IMPATT or Read avalanche diode, a negative-resistance semiconductor device that is now coming into wide-spread use... View More

Advertisement