IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improving Acquisition Time in Scanning Microwave Microscopy by Undersampling the Scan Area

2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS)

Author(s): Markus F. Wieghaus ; Olaf C. Haenssler ; Sergej Fatikow
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2018
Conference Location: Nagoya, Japan, Japan
Conference Date: 4 July 2018
Page(s): 1 - 6
ISBN (Electronic): 978-1-5386-4841-4
ISBN (USB): 978-1-5386-4840-7
DOI: 10.1109/MARSS.2018.8481148
Regular:

Scanning Microwave Microscopy (SMM) is a tool with high potential to analyze and characterize nanomaterials. A disadvantage of this technique is the scanning speed when using a Vector Network... View More

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