IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dual Low-Rank Decompositions for Robust Cross-View Learning

Author(s): Zhengming Ding ; Yun Fu
Sponsor(s): IEEE Signal Processing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2019
Volume: 28
Page(s): 194 - 204
ISSN (Electronic): 1941-0042
ISSN (Paper): 1057-7149
DOI: 10.1109/TIP.2018.2865885
Regular:

Cross-view data are very popular contemporarily, as different viewpoints or sensors attempt to richly represent data in various views. However, the cross-view data from different views present a... View More

Advertisement