IEEE - Institute of Electrical and Electronics Engineers, Inc. - Theoretical and Cold-Test Investigation of a Four-Port High-Frequency System for a 0.14-THz Dual-Sheet-Beam Backward-Wave Oscillator

Author(s): Xiaopin Tang ; Ziqiang Yang ; Karim Khan ; Naseer Muhammad ; Zhengbiao Ouyang
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 7
ISSN (Electronic): 1557-9646
ISSN (Paper): 0018-9383
DOI: 10.1109/TED.2018.2869855
Regular:

A four-port high-frequency system for a 0.14-THz dual-sheet-beam hole-grating backward-wave oscillator (BWO) is presented in this paper. The hole-grating slow-wave structure consists of two... View More

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