IEEE - Institute of Electrical and Electronics Engineers, Inc. - BRDF Analysis with Directional Statistics and Its Applications

Author(s): Jie Guo ; Yanwen Guo ; Jingui Pan ; Wenzhou Lu
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Comput. Graphics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2160-9306
ISSN (Electronic): 1941-0506
ISSN (Paper): 1077-2626
DOI: 10.1109/TVCG.2018.2872709
Regular:

Data-driven BRDF models using real material measurements have become increasingly prevalent due to the development of novel gonioreflectometers, but efficient use of these models in many... View More

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