IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Deep Learning-Based Feature Extraction Framework for System Security Assessment

Author(s): Mingyang Sun ; Ioannis Konstantelos ; Goran Strbac
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1949-3061
ISSN (Paper): 1949-3053
DOI: 10.1109/TSG.2018.2873001
Regular:

The ongoing decarbonisation of modern electricity systems has led to a substantial increase of operational uncertainty, particularly due to the large-scale integration of renewable energy... View More

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