IEEE - Institute of Electrical and Electronics Engineers, Inc. - Contour Extraction and Quality Inspection for Inner Structure of Deep Hole Components

Author(s): Xin-Yi Gong ; Hu Su ; De Xu ; Hua-Bin Yang ; Zheng-Tao Zhang ; Lei Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2156-3985
ISSN (Paper): 2156-3950
DOI: 10.1109/TCPMT.2018.2873207
Regular:

The paper focuses on the contour extraction for the inner wires of a kind of deep hole component to achieve a high-accuracy inspection. The vision system consisting of a cam-era and an endoscope... View More

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