IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic Tuning of the RBF Kernel Parameter for Batch-Mode Active Learning Algorithms: A Scalable Framework

Author(s): Chin-Chun Chang ; Hsin-Ta Huang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 13
ISSN (Electronic): 2168-2275
ISSN (Paper): 2168-2267
DOI: 10.1109/TCYB.2018.2869861
Regular:

Batch-mode active learning algorithms can select a batch of valuable unlabeled samples to manually annotate for reducing the total cost of labeling every unlabeled sample. To facilitate selection... View More

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