IEEE - Institute of Electrical and Electronics Engineers, Inc. - S-Parameter Model of Three Parallel Interconnect Lines Generating Negative Group- Delay Effect

Author(s): Fayu Wan ; Ningdong Li ; Blaise Ravelo ; Qizheng Ji ; Junxiang Ge
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2018.2872732
Regular:

This paper developpes a negative group-delay (NGD) microwave circuit theory regarding topology consists of three parallel interconnect lines (3-PILs). The NGD topology under study is built using... View More

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