IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new method for measuring topological structure similarity between complex trajectories

Author(s): Huimeng Wang ; Yunyan Du ; Jiawei Yi ; Yong Sun ; Fuyuan Liang
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2326-3865
ISSN (Electronic): 1558-2191
ISSN (Paper): 1041-4347
DOI: 10.1109/TKDE.2018.2872523
Regular:

We proposed a new framework to measure the similarity of topological structure between complex trajectories. A complex trajectory is first represented by a graph structure with nodes and edges.... View More

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