IEEE - Institute of Electrical and Electronics Engineers, Inc. - MSFD: Multi-scale segmentation based feature detection for wide-baseline scene reconstruction

Author(s): Armin Mustafa ; Hansung Kim ; Adrian Hilton
Sponsor(s): IEEE Signal Processing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1941-0042
ISSN (Paper): 1057-7149
DOI: 10.1109/TIP.2018.2872906
Regular:

A common problem in wide-baseline matching is the sparse and non-uniform distribution of correspondences when using conventional detectors such as SIFT, SURF, FAST, A-KAZE and MSER. In this paper... View More

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