IEEE - Institute of Electrical and Electronics Engineers, Inc. - Datation of faults for Markovian Stochastic DESs

Author(s): R. Ammour ; E. Leclercq ; E. Sanlaville ; D. Lefebvre
Sponsor(s): IEEE Control Systems Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2334-3303
ISSN (Electronic): 1558-2523
ISSN (Paper): 0018-9286
DOI: 10.1109/TAC.2018.2872490
Regular:

This technical note concerns the fault diagnosis of stochastic discrete event systems. Specifically, the goal is to characterize a detected fault by estimating its occurrence date. For that... View More

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