IEEE - Institute of Electrical and Electronics Engineers, Inc. - When and How to Apply Statistics, Machine Learning and Deep Learning Techniques

2018 20th International Conference on Transparent Optical Networks (ICTON)

Author(s): Josep Lluis Berral-Garcia
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2018
Conference Location: Bucharest, Romania, Romania
Conference Date: 1 July 2018
Page(s): 1 - 4
ISBN (Electronic): 978-1-5386-6605-0
ISBN (USB): 978-1-5386-6604-3
ISSN (Electronic): 2161-2064
DOI: 10.1109/ICTON.2018.8473910
Regular:

Machine Learning has become 'commodity' in engineering and experimental sciences, as calculus and statistics did before. After the hype produced during the 00's, machine learning (statistical... View More

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