IEEE - Institute of Electrical and Electronics Engineers, Inc. - Nanoscale Investigations of Optical Fiber by Using Scattering Scanning Near-Field Optical Microscopy

2018 20th International Conference on Transparent Optical Networks (ICTON)

Author(s): Denis E. Tranca ; Catalin Stoichita ; Radu Hristu ; Stefan G. Stanciu ; Charles V. Sammut ; George A. Stanciu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2018
Conference Location: Bucharest, Romania, Romania
Conference Date: 1 July 2018
Page(s): 1 - 3
ISBN (Electronic): 978-1-5386-6605-0
ISBN (USB): 978-1-5386-6604-3
ISSN (Electronic): 2161-2064
DOI: 10.1109/ICTON.2018.8473744
Regular:

Scattering Scanning Near-field Optical Microscopy (s-SNOM) is proposed as a powerful tool for quantitative analysis of cross-sectional area of optical fibers. The s-SNOM images are processed... View More

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