IEEE - Institute of Electrical and Electronics Engineers, Inc. - Transfer Learning for Object Detection using State-of-the-Art Deep Neural Networks

2018 5th International Conference on Signal Processing and Integrated Networks (SPIN)

Author(s): J. Talukdar ; S. Gupta ; P. S. Rajpura ; R. S. Hegde
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2018
Conference Location: Noida, Delhi-NCR, India, India
Conference Date: 22 February 2018
Page(s): 78 - 83
ISBN (CD): 978-1-5386-3044-0
ISBN (Electronic): 978-1-5386-3045-7
DOI: 10.1109/SPIN.2018.8474198
Regular:

Transfer learning through the use of synthetic images and pretrained convolutional neural networks offers a promising approach to improve the object detection performance of deep neural networks.... View More

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