IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Reduced KELM model using DBSCAN Clustering algorithm for centroid selection

2018 5th International Conference on Signal Processing and Integrated Networks (SPIN)

Author(s): Sukirty Jain ; Sanyam Shukla
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2018
Conference Location: Noida, Delhi-NCR, India, India
Conference Date: 22 February 2018
Page(s): 702 - 707
ISBN (CD): 978-1-5386-3044-0
ISBN (Electronic): 978-1-5386-3045-7
DOI: 10.1109/SPIN.2018.8474165
Regular:

Extreme Learning Machine (ELM) is a single layer feedforward neural network (SLFN) and a popular classifier for classification and regression problems. It is unstable due to random initialization... View More

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