IEEE - Institute of Electrical and Electronics Engineers, Inc. - NI-Lab VIEW Based Automated Testing of Electronic Control Unit

2018 Second International Conference on Inventive Communication and Computational Technologies (ICICCT)

Author(s): H. R. Sukhesh ; M. Mahesh
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2018
Conference Location: Coimbatore, India, India
Conference Date: 20 April 2018
Page(s): 96 - 101
ISBN (Electronic): 978-1-5386-1974-2
ISBN (DVD): 978-1-5386-1973-5
DOI: 10.1109/ICICCT.2018.8472990
Regular:

The incorporation of automated testing methods are becoming a benchmarking accepted solutions in the sphere of automotive industry. This paper furnishes a novel technique of testing an Electronic... View More

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