IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Multiple-Model Reliability Prediction Approach for Condition-Based Maintenance

Author(s): Kim Verbert ; Bart De Schutter ; Robert Babuska
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Volume: 67
Page(s): 1,364 - 1,376
ISSN (Electronic): 1558-1721
ISSN (Paper): 0018-9529
DOI: 10.1109/TR.2018.2825470
Regular:

Numerous prognostic methods have been developed, aiming at predicting future system reliability with the highest possible accuracy. It is striking that the relation with the subsequent maintenance... View More

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