IEEE - Institute of Electrical and Electronics Engineers, Inc. - Charge-Based Distortion Analysis of Nanoscale MOSFETs

Author(s): Francesco Chicco ; Alessandro Pezzotta ; Christian C. Enz
Sponsor(s): IEEE Circuits and Systems Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 10
ISSN (Electronic): 1558-0806
ISSN (Paper): 1549-8328
DOI: 10.1109/TCSI.2018.2868387
Regular:

This paper presents a study of MOSFETs' linearity, exploiting a simplified version of the charge-based EKV model. It allows to deduce analytically the one-tone and two-tone harmonic distortions... View More

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