IEEE - Institute of Electrical and Electronics Engineers, Inc. - Frequency Stability Measurement of Cryogenic Sapphire Oscillators with a Multichannel Tracking DDS and the Two-Sample Covariance

Author(s): Claudio E. Calosso ; Francois Vernotte ; Vincent Giordano ; Christophe Fluhr ; Benoit Dubois ; Enrico Rubiola
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1525-8955
ISSN (Paper): 0885-3010
DOI: 10.1109/TUFFC.2018.2870593
Regular:

This article shows the first measurement of three 100 MHz signals exhibiting fluctuations from 2×10-16 to parts in 10-15 for integration time τ between 1 s and 1 day. Such stable signals are... View More

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