IEEE - Institute of Electrical and Electronics Engineers, Inc. - Intelligent Content Based X-Ray Image Retrieval using Speeded up Robust Feature Descriptors

2017 IEEE International WIE Conference on Electrical and Computer Engineering (WIECON-ECE)

Author(s): M.V Lahari ; B Niranjana Krupa
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2017
Conference Location: Dehradun, India, India
Conference Date: 18 December 2017
Page(s): 70 - 73
ISBN (CD): 978-1-5386-2620-7
ISBN (Electronic): 978-1-5386-2621-4
DOI: 10.1109/WIECON-ECE.2017.8468926
Regular:

In this paper, an intelligent CBMIR system developed to classify and search for relevant X-ray images is presented. Here, a total of 1750 X-ray images from Image Retrieval in Medical Applications... View More

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