IEEE - Institute of Electrical and Electronics Engineers, Inc. - Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process On-Chip Antennas

Author(s): Alessandro Finocchiaro ; Giovanni Girlando ; Alessandro Motta ; Alberto Pagani ; Egidio Ragonese ; Giuseppe Palmisano
Sponsor(s): IEEE Circuits and Systems Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Volume: 65
Page(s): 1,355 - 1,359
ISSN (Electronic): 1558-3791
ISSN (Paper): 1549-7747
DOI: 10.1109/TCSII.2018.2852949
Regular:

This brief demonstrates a fully contactless wafer-level testing based on UHF radio identification (RFID) technology enriched by high-quality on-chip antenna. The antenna, which uses exactly the... View More

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