IEEE - Institute of Electrical and Electronics Engineers, Inc. - Repairing Process Models Containing Choice Structures via Logic Petri Nets

Author(s): Xize Zhang ; Yuyue Du ; Liang Qi ; Haichun Sun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2018.2870727
Regular:

The process knowledge can be extracted based on the process mining technology from event logs, which can be generated from information systems. The event logs can be mined to construct a process... View More

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