IEEE - Institute of Electrical and Electronics Engineers, Inc. - IVDST: A Fast Algorithm for Atomic Norm Minimization in Line Spectral Estimation

Author(s): Yue Wang ; Zhi Tian
Sponsor(s): IEEE Signal Processing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1558-2361
ISSN (Paper): 1070-9908
DOI: 10.1109/LSP.2018.2870539
Regular:

This work presents a fast algorithm named iterative Vandermonde decomposition and shrinkage-thresholding (IVDST), which offers a low-complexity solution to atomic norm minimization (ANM) in... View More

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